Patent · US Expired

Three-transistor DRAM cell and associated fabrication method

US6661701B2 · kind B2 · utility

6Cited by
7References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 2002
Grant dateDec 9, 2003
Priority date
Expiry dateMay 30, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/00

Abstract

The three-transistor DRAM cell has a memory transistor formed as a field-effect transistor with a short-channel section and a long-channel section. A second insulating layer and a conductive layer are additionally formed on a gate layer of the memory transistor. A substantially constant voltage value is present between a potential of the conductive layer and a potential of the substrate area. A three-transistor DRAM cell with improved interference immunity and charge retention time

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.