Patent · US Expired

Method and system for programming a memory device

US6661724B1 · kind B1 · utility

68Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 13, 2002
Grant dateDec 9, 2003
Priority date
Expiry dateJun 13, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for programming a memory device is disclosed. In one method embodiment, the present invention receives a measurement from a temperature sensor located near a non-volatile programmable memory device. Next, a transformation is accessed. Then, the measurement from the temperature sensor is processed in conjunction with the transformation to establish a programming time for a memory device as a function of a programming voltage and the temperature of the memory device. The programming voltage is then applied to the memory device for the length of time specified by the programming time during the programming pulse of the memory device to accurately program the device using an optimum amount of current.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.