Mark Rouse
10Patents
5h-index
13Co-inventors
59Inventor score
Filing activity: Dec 23, 1996 → Sep 29, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6661724B1 | Method and system for programming a memory device | Physics | 68 | Expired |
| US6657241B1 | ESD structure having an improved noise immunity in CMOS and BICMOS semiconductor devices | Electricity | 10 | Expired |
| US6829190B1 | Method and system for programming a memory device | Physics | 10 | Expired |
| US9632629B2 | Sensor patterns with reduced noise coupling | Physics | 7 | Active |
| US7586795B2 | Variable reference voltage circuit for non-volatile memory | Physics | 7 | Active |
| US7952942B1 | Variable reference voltage circuit for non-volatile memory | Physics | 4 | Active |
| US5936973A | Test mode latching scheme | Physics | 3 | Expired |
| US6492706B1 | Programmable pin flag | Electricity | 1 | Expired |
| US8325540B1 | Variable reference voltage circuit for non-volatile memory | Physics | 1 | Active |
| US7747911B1 | Self verification of non-volatile memory | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.