Patent · US Expired

ZnO crystal growth method, ZnO crystal structure, and semiconductor device using ZnO crystal

US6664565B1 · kind B1 · utility

16Cited by
2References
16Claims
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Key dates

Filing dateAug 25, 2000
Grant dateDec 16, 2003
Priority date
Expiry dateFeb 1, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02631
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A ZnO crystal growing method having the steps of: growing a low temperature growth ZnO layer on a sapphire substrate at a temperature lower than a single crystal ZnO growth temperature; thermally processing the low temperature growth ZnO layer at a temperature near to a growth temperature of a high temperature growth single crystal ZnO layer higher than the growth temperature low temperature growth ZnO layer; and growing a high temperature growth single crystal ZnO layer on the low temperature growth ZnO layer at a temperature higher than the growth temperature of the of the low temperature growth ZnO layer. ZnO crystal of good quality with a reduced number of crystal defects can be grown on a sapphire substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.