Semiconductor circuit having increased susceptibility to ionizing radiation
US6665161B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2000 |
| Grant date | Dec 16, 2003 |
| Priority date | — |
| Expiry date | Jul 19, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F30/301
Abstract
A radiation-susceptible integrated circuit comprises radiation sensor, a differential amplifier and circuit disabler. The radiation sensor includes two devices that have a different tolerance to ionizing radiation. When exposed to a total dose of ionizing radiation that exceeds the radiation tolerance of one of the devices but not the other, only the more radiation-susceptible device will exhibit an increase in leakage current. The differential amplifier is operable to generate an output signal having a value that is indicative of a difference or offset that exists between the output of the two devices. The output signal from the differential amplifier is received by the circuit disabler, which is activated, or not, as a function of the value of the output signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.