Frederick Brady
51Patents
12h-index
45Co-inventors
84Inventor score
Filing activity: Apr 30, 1993 → Aug 3, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6660564B2 | Wafer-level through-wafer packaging process for MEMS and MEMS package produced thereby | Electricity | 134 | Expired |
| US7859033B2 | Wafer level processing for backside illuminated sensors | Electricity | 105 | Active |
| US5358879A | Method of making gate overlapped lightly doped drain for buried channel devices | Emerging Cross-Sectional Technologies | 89 | Expired |
| US5360752A | Method to radiation harden the buried oxide in silicon-on-insulator structures | Emerging Cross-Sectional Technologies | 39 | Expired |
| US5314841A | Method of forming a frontside contact to the silicon substrate of a SOI wafer | Electricity | 31 | Expired |
| US7763913B2 | Imaging method, apparatus, and system providing improved imager quantum efficiency | Electricity | 26 | Active |
| US6841861B2 | MEMS package | Electricity | 24 | Expired |
| US5527724A | Method to prevent latch-up and improve breakdown volatge in SOI mosfets | Emerging Cross-Sectional Technologies | 23 | Expired |
| US7915067B2 | Backside illuminated image sensor with reduced dark current | Electricity | 15 | Active |
| US6034399A | Electrostatic discharge protection for silicon-on-insulator | Electricity | 15 | Expired |
| US8119435B2 | Wafer level processing for backside illuminated image sensors | Electricity | 12 | Active |
| US6665161B1 | Semiconductor circuit having increased susceptibility to ionizing radiation | Electricity | 12 | Expired |
| US8017426B2 | Color filter array alignment mark formation in backside illuminated image sensors | Electricity | 11 | Active |
| US8076170B2 | Backside illuminated image sensor with shallow backside trench for photodiode isolation | Electricity | 10 | Active |
| US6399989B1 | Radiation hardened silicon-on-insulator (SOI) transistor having a body contact | Electricity | 9 | Expired |
| US8847136B2 | Conversion gain modulation using charge sharing pixel | Electricity | 7 | Active |
| US9398237B2 | Image sensor with floating diffusion interconnect capacitor | Electricity | 6 | Active |
| US7821046B2 | Methods, structures and sytems for an image sensor device for improving quantum efficiency of red pixels | Electricity | 6 | Active |
| US8953075B2 | CMOS image sensors implementing full frame digital correlated double sampling with global shutter | Electricity | 5 | Active |
| US7432121B2 | Isolation process and structure for CMOS imagers | Electricity | 4 | Active |
| US6441440B1 | Semiconductor device and circuit having low tolerance to ionizing radiation | Electricity | 4 | Expired |
| US6762128B2 | Apparatus and method for manufacturing a semiconductor circuit | Electricity | 4 | Expired |
| US6794733B1 | Increasing the susceptability of an integrated circuit to ionizing radiation | Emerging Cross-Sectional Technologies | 4 | Expired |
| US11240449B2 | Solid-state imaging device and imaging device with combined dynamic vision sensor and imaging functions | Electricity | 3 | Active |
| US6638832B2 | Elimination of narrow device width effects in complementary metal oxide semiconductor (CMOS) devices | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.