Electrical test probes and methods of making the same
US6667629B2 · kind B2 · utility
9Cited by
25References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2002 |
| Grant date | Dec 23, 2003 |
| Priority date | — |
| Expiry date | Sep 24, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06722
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.