Larre H. Nelson
6Patents
5h-index
5Co-inventors
52Inventor score
Filing activity: May 17, 2002 → Apr 24, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6685492B2 | Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition | Electricity | 34 | Expired |
| US6992496B2 | Apparatus for interfacing electronic packages and test equipment | Physics | 29 | Expired |
| US7315176B2 | Electrical test probes, methods of making, and methods of using | Electricity | 20 | Expired |
| US6667629B2 | Electrical test probes and methods of making the same | Physics | 9 | Expired |
| US7362114B2 | Apparatus for interfacing electronic packages and test equipment | Physics | 7 | Active |
| US9910069B1 | Biasing method and device construction for a spring probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.