Ion source and mass spectrometer
US6677582B2 · kind B2 · utility
9Cited by
3References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2001 |
| Grant date | Jan 13, 2004 |
| Priority date | — |
| Expiry date | Jan 11, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/168
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An apparatus for detecting the minor constituents of a sample with high efficiency in positive and negative ion monitoring modes. The directions in which the sample gas is forced to flow in the ionized region within the ion source are properly switched in the positive and negative ion monitoring modes, respectively, thereby enabling both positive ions and negative ions to be detected with high sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.