Method and apparatus for quantitative phase analysis of textured polycrystalline materials
US6678347B1 · kind B1 · utility
7Cited by
6References
21Claims
0Family size
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Key dates
| Filing date | Jul 26, 2002 |
| Grant date | Jan 13, 2004 |
| Priority date | — |
| Expiry date | Jul 26, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.