Patent · US Expired

Method of manufacturing semiconductor devices by dividing wafer into chips and such semiconductor devices

US6680241B2 · kind B2 · utility

17Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 14, 2000
Grant dateJan 20, 2004
Priority date
Expiry dateDec 14, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A plurality of chips divided from a semiconductor wafer having a plurality of semiconductor integrated circuits formed on a front surface of the wafer, are prepared, front surfaces of the chips being bonded to a first wafer sheet. The back and side surfaces of each chip bonded to the first wafer sheet are covered with a reinforcing thin film. Each of the plurality of chips is removed from the first wafer sheet. The flexural strength of a chip can be suppressed from being lowered by chipping and chip cracks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.