Scan chain connectivity
US6681356B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2000 |
| Grant date | Jan 20, 2004 |
| Priority date | — |
| Expiry date | Dec 18, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Scan chains are designed for an IC based on test coverage for functional logic units, Before physical placement the scan circuit elements are assigned scan attributes which define which scan circuit elements must remain coupled and also defines which groups of scan circuit elements must remain in selected groups. The scan chains and the logic are physically placed and location data on the scan circuit elements are determined from the placement data. Using the scan attributes, single scan circuit elements and scan circuit elements that must remain connected (sub-scan chains) are re-allocated across a same number of new scan chains. These scan circuit elements are rewired using an algorithm that minimizes scan path lengths within the new scan chains.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.