Patent · US Expired

Nucleation layer for improved light extraction from light emitting devices

US6683327B2 · kind B2 · utility

15Cited by
10References
26Claims
0Family size

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Inventors

Key dates

Filing dateNov 13, 2001
Grant dateJan 27, 2004
Priority date
Expiry dateNov 13, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/0137

Abstract

A light emitting device including a nucleation layer containing aluminum is disclosed. The thickness and aluminum composition of the nucleation layer are selected to match the index of refraction of the substrate and device layers, such that 90% of light from the device layers incident on the nucleation layer is extracted into the substrate. In some embodiments, the nucleation layer is AlGaN with a thickness between about 1000 and about 1200 angstroms and an aluminum composition between about 2% and about 8%. In some embodiments, the nucleation layer is formed over a surface of a wurtzite substrate that is miscut from the c-plane of the substrate. In some embodiments, the nucleation layer is formed at high temperature, for example between 900° and 1200° C. In some embodiments, the nucleation layer is doped with Si to a concentration between about 3e18 cm−3 and about 5e19 cm−3.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.