Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
US6685492B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2002 |
| Grant date | Feb 3, 2004 |
| Priority date | — |
| Expiry date | May 17, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R2201/20
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.