Patent · US Expired

Test device and method for electrically testing electronic device

US6687868B1 · kind B1 · utility

26Cited by
5References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 5, 2000
Grant dateFeb 3, 2004
Priority date—
Expiry dateApr 5, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31919
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test device for electrically testing an electronic device (DUT) 100 comprises a pattern memory 13A, a pattern generator 13, a first filter 20B, and a pin electronic assembly 19. The pattern memory 13A stores data defining test patterns to be supplied to the DUT 100. The pattern generator 13 generates a plurality of test patterns to be input to a plurality of input pins of the DUT using digital signals based on the data stored in the pattern memory 13A. The first filter converts at least one of the plurality of test patterns to analog signals. The pin electronic assembly 19 supplies the plurality of test patterns including the analog signal test pattern to the DUT 100.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.