Patent · US Expired

High-pressure drying apparatus, high-pressure drying method and substrate processing apparatus

US6691430B2 · kind B2 · utility

20Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 2003
Grant dateFeb 17, 2004
Priority date
Expiry dateMar 4, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Liquid for prevention of substrate drying is supplied into a processing chamber so that a pool of the liquid is created as an anti-drying atmosphere in advance inside a processing chamber, and substrates, as they are dipped in the pool, are kept on stand-by in a substrate board. In this manner, air drying of the substrates which are kept on stand-by is prevented. When the number of the substrates in the substrate board reaches a certain number, the anti-drying atmosphere is removed from the processing chamber, which is followed by introduction of an SCF into the processing chamber and supercritical drying (high pressure drying) of all of the plurality of substrates inside the processing chamber, namely, batch supercritical drying.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.