Patent · US Expired

Semiconductor integrated circuit

US6693448B1 · kind B1 · utility

6Cited by
5References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 2001
Grant dateFeb 17, 2004
Priority date
Expiry dateFeb 23, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is led out of the semiconductor integrated circuit through a common external output terminal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.