Patent · US Expired

Interconnect structures and a method of electroless introduction of interconnect structures

US6696758B2 · kind B2 · utility

28Cited by
19References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 2002
Grant dateFeb 24, 2004
Priority date
Expiry dateNov 7, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus including a substrate comprising a device having contact point; a dielectric layer overlying the device with an opening to the contact point; and an interconnect structure disposed in the opening including an interconnect material and a different conductive shunt material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.