Contact probe with off-centered back-drilled aperture
US6696850B1 · kind B1 · utility
23Cited by
19References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 2, 2002 |
| Grant date | Feb 24, 2004 |
| Priority date | — |
| Expiry date | Oct 2, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spring probe having a barrel, plunger and a back-drilled aperture is provided in which the centerline axis of the aperture is separate from the longitudinal axis of the plunger. A portion of the spring force directed along the longitudinal axis of the probe is transferred to a side force to bias the plunger against the barrel for electrical contact. The lighter, more uniform biasing and slight rotation/agitation of the plunger within that barrel increases the probe life and electrical performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.