Patent · US Expired

Microvia inspection system

US6697154B2 · kind B2 · utility

7Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 2001
Grant dateFeb 24, 2004
Priority date
Expiry dateJan 11, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30141
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system has a projection lens directing on-axis light and low level LEDs directing light to blind microvias. A high resolution camera captures blind microvia images and an image processor recognizes defects according to classifications according to reflected light area and centroid position. The lens is telecentric for particularly effective image capture in blind microvias. The system also has an array of 6000 back lighting LEDs providing illumination for capture of images by a camera. These images are analyzed by the image processor to detect defects such as blocked through microvias.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.