Adrian Boyle
19Patents
9h-index
18Co-inventors
65Inventor score
Filing activity: Dec 23, 1999 → Feb 9, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7776720B2 | Program-controlled dicing of a substrate using a pulsed laser | Performing Operations; Transporting | 133 | Active |
| US7887712B2 | Laser machining system and method | Emerging Cross-Sectional Technologies | 44 | Expired |
| US6781093B2 | Circuit singulation system and method | Electricity | 37 | Expired |
| US7989320B2 | Die bonding | Electricity | 33 | Active |
| US6841482B2 | Laser machining of semiconductor materials | Performing Operations; Transporting | 33 | Expired |
| US6586707B2 | Control of laser machining | Performing Operations; Transporting | 30 | Expired |
| US6671397B1 | Measurement system having a camera with a lens and a separate sensor | Physics | 23 | Expired |
| US10163213B2 | 3D point clouds | Physics | 10 | Active |
| US10116841B2 | Relation to underwater imaging for underwater surveys | Emerging Cross-Sectional Technologies | 9 | Active |
| US10116842B2 | Gathering range and dimensional information for underwater surveys | Emerging Cross-Sectional Technologies | 7 | Active |
| US10158793B2 | Processing survey data of an underwater scene | Emerging Cross-Sectional Technologies | 7 | Active |
| US6697154B2 | Microvia inspection system | Physics | 7 | Expired |
| US6697151B2 | Material inspection | Performing Operations; Transporting | 5 | Expired |
| US6983066B2 | Machine vision | Physics | 4 | Expired |
| US10930013B2 | Method and system for calibrating imaging system | Physics | 3 | Active |
| US10943321B2 | Method and system for processing image data | Physics | 1 | Active |
| US8551792B2 | Dicing a semiconductor wafer | Performing Operations; Transporting | 1 | Active |
| US9352417B2 | Increasing die strength by etching during or after dicing | Performing Operations; Transporting | 0 | Active |
| US8048774B2 | Methods and systems for laser machining a substrate | Emerging Cross-Sectional Technologies | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.