Digitizer apparatus and semiconductor testing apparatus
US6700515B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 26, 2003 |
| Grant date | Mar 2, 2004 |
| Priority date | — |
| Expiry date | Feb 26, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An interleaving AD conversion type waveform digitizer apparatus includes, in a case where the number of interleaving ways is N that is equal to or larger than two, N AD converters connected to a structure for interleaving. The sampling timings of the respective AD converters are predetermined timings corresponding to the interleaving structure so as to allow successive outputs. The digitizer receives a signal to be measured output from a device under test and performs quantization. The time-series data from the AD converters are subjected to Fourier Transform by a butterfly operation technique. The digitizer apparatus further includes a window function multiplier for determining a coefficient based on a phase error, and a butterfly operation unit for performing a butterfly operation by inserting a phase correction coefficient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.