Method for reliability testing leakage characteristics in an electronic circuit and a testing device for accomplishing the source
US6701270B1 · kind B1 · utility
61Cited by
9References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2001 |
| Grant date | Mar 2, 2004 |
| Priority date | — |
| Expiry date | May 14, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2879
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method for reliability testing leakage characteristics in an electronic circuit, and a testing device for accomplishing the same. In an advantageous embodiment, the method includes dividing conductors of an electronic circuit into at least first and second noninterleaved regions having at least two conductors each. The method further includes forming conductor nets by electrically connecting ones of the at least two conductors of the first region to ones of the at least two conductors of the second region then testing for electrical leakage in the conductor nets.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.