Patent · US Expired

Method and apparatus for determining the width of a memory subsystem

US6704850B1 · kind B1 · utility

13Cited by
17References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 23, 2000
Grant dateMar 9, 2004
Priority date
Expiry dateJan 5, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F12/0684
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for determining a width of an external memory is described. The method comprises reading a data from memory, and if the data matches an expected data key, determining the width of the memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.