Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices

US6708298B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• William E. Corbin, Jr. · Newburgh, US
• David P. Monty · South Burlington, US
• Erik A. Nelson · Waterbury, US
• Alan D. Norris · South Burlington, US
• Steven W. Tomashot · Williston, US
• David Chapman · Shelburne, US
• Timothy Fiscus · Beaver, US

Key dates

• Filing date: Jan 23, 2001
• Grant date: Mar 16, 2004
• Expiry date: Mar 29, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C29/50
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method for testing the data strobe window (DQS) and data valid window (tDV) of a memory device (e.g., a DDR-type memory device) using the window strobe of a testing system.