Rapid in-situ mastering of an aspheric fizeau
US6714308B2 · kind B2 · utility
15Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 3, 2002 |
| Grant date | Mar 30, 2004 |
| Priority date | — |
| Expiry date | Sep 3, 2022 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/24917
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Interferometric apparatus and methods by which aspheric surfaces and wavefronts may be precisely measured. The apparatus is provided with two modes of operation. In one mode, the apparatus is configured generally as a Fizeau interferometer in which an aspheric reference surface is used to permit the rapid, robust measurement of the difference between the aspheric reference surface and an aspheric test optic or wavefront. In another mode of operation, the aspheric test surface itself is completely characterized through in-situ use of an interferometric scanning technique using a spherical reference surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.