Michael Kuchel
23Patents
12h-index
10Co-inventors
78Inventor score
Filing activity: Mar 7, 1988 → Dec 8, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4872755A | Interferometer for measuring optical phase differences | Physics | 66 | Expired |
| US5135308A | Method and apparatus for non-contact measuring of object surfaces | Physics | 46 | Expired |
| US5135309A | Method and apparatus for non-contact measuring of object surfaces | Physics | 41 | Expired |
| US6879402B2 | Scanning interferometer for aspheric surfaces and wavefronts | Physics | 36 | Expired |
| US5361312A | Method and apparatus for phase evaluation of pattern images used in optical measurement | Physics | 24 | Expired |
| US5343294A | Method for analyzing periodic brightness patterns | Physics | 22 | Expired |
| US5054912A | Optical distance-measuring device | Physics | 20 | Expired |
| US6781700B2 | Scanning interferometer for aspheric surfaces and wavefronts | Physics | 19 | Expired |
| US6972849B2 | Scanning interferometer for aspheric surfaces and wavefronts | Physics | 17 | Expired |
| US6717680B1 | Apparatus and method for phase-shifting interferometry | Physics | 17 | Expired |
| US5357341A | Method for evaluating interferograms and interferometer therefor | Physics | 15 | Expired |
| US6714308B2 | Rapid in-situ mastering of an aspheric fizeau | Emerging Cross-Sectional Technologies | 15 | Expired |
| US7289224B2 | Low coherence grazing incidence interferometry for profiling and tilt sensing | Physics | 12 | Expired |
| US6717679B2 | Dispersive null-optics for aspheric surface and wavefront metrology | Physics | 8 | Expired |
| US7218403B2 | Scanning interferometer for aspheric surfaces and wavefronts | Physics | 5 | Expired |
| US7612893B2 | Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts | Physics | 5 | Active |
| US6816267B2 | Apparatus and method for calibrating an interferometer using a selectively rotatable sphere | Physics | 4 | Expired |
| US6734979B2 | Rapid in situ mastering of an aspheric Fizeau with residual error compensation | Physics | 4 | Expired |
| US7889356B2 | Two grating lateral shearing wavefront sensor | Physics | 3 | Active |
| US5106194A | Method and apparatus for absolute interferometric testing of plane surfaces | Physics | 3 | Expired |
| US7948638B2 | Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts | Physics | 2 | Active |
| US5042041A | Radiation source for partially coherent radiation | Electricity | 1 | Expired |
| US6943896B2 | Reconfigurable interferometer system | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.