Porous semiconductor-based optical interferometric sensor

US6720177B2 · kind B2 · utility

Assignees

• The Regents of the University of California · US
• THE SCRIPPS RESEARCH INSTITUTE · US

Inventors

• M. Reza Ghadiri · Del Mar, US
• Michael J. Sailor · Village of La Jolla, US
• Kianoush Motesharei · Village of La Jolla, US
• Shang-Yi Lin · Taichung, TW
• Keiki-Pua S. Dancil · Makawao, US

Key dates

• Filing date: Feb 28, 2001
• Grant date: Apr 13, 2004
• Expiry date: Aug 2, 2021

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S436/805
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The measurement of the wavelength shifts in the reflectometric interference spectra of a porous semiconductor substrate such as silicon, make possible the highly sensitive detection, identification and quantification of small analyte molecules. The sensor of the subject invention is effective in detecting multiple layers of biomolecular interactions, termed “cascade sensing”, including sensitive detection of small molecule recognition events that take place relatively far from the semiconductor surface.