Patent · US Expired

Avalanche photodiode for photon counting applications and method thereof

US6720588B2 · kind B2 · utility

31Cited by
5References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 13, 2002
Grant dateApr 13, 2004
Priority date
Expiry dateNov 29, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F30/225

Abstract

An improved APD structure and an improved manner of operating APD's particularly beneficial for a single photon detection applications are provided. An APD is provided having an absorption region, a control region, and a multiplication region, wherein the multiplication region has a k value of approximately 1. In one example the multiplication region comprises a doped InP layer. The field control layer is designed so as to produce a reduction of electric field that is equal to the multiplication region's breakdown electric field, plus or minus 5V/&mgr;m. The method comprises applying a potential across the APD so as to induce an electric field across the multiplication region that exceeds the breakdown field; while having the control region shield the absorption region to prevent excessive noise.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.