Inventor · Brookline, MA, US

James S. Vickers

27Patents
12h-index
18Co-inventors
78Inventor score

Filing activity: Jun 11, 1996 → Dec 10, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US7256055B2 System and apparatus for using test structures inside of a chip during the fabrication of the chip Electricity 108 Expired
US7736916B2 System and apparatus for using test structures inside of a chip during the fabrication of the chip Electricity 93 Active
US8344745B2 Test structures for evaluating a fabrication of a die or a wafer Electricity 88 Active
US6621275B2 Time resolved non-invasive diagnostics system Physics 68 Expired
US6594086B1 Bi-convex solid immersion lens Physics 33 Expired
US6720588B2 Avalanche photodiode for photon counting applications and method thereof Electricity 31 Expired
US7220990B2 Technique for evaluating a fabrication of a die and wafer Electricity 30 Expired
US6797581B2 Avalanche photodiode for photon counting applications and method thereof Electricity 22 Expired
US6778327B2 Bi-convex solid immersion lens Physics 20 Expired
US7224828B2 Time resolved non-invasive diagnostics system Physics 19 Expired
US7423288B2 Technique for evaluating a fabrication of a die and wafer Electricity 14 Active
US7605597B2 Intra-chip power and test signal generation for use with test structures on wafers Electricity 14 Active
US5693946A Single photon imaging with a Bi-Linear charge-coupled device array Physics 12 Expired
US7339388B2 Intra-clip power and test signal generation for use with test structures on wafers Electricity 11 Expired
US7492529B2 Bi-convex solid immersion lens Physics 8 Active
US9201096B2 Laser-assisted device alteration using synchronized laser pulses Physics 6 Active
US7227702B2 Bi-convex solid immersion lens Physics 6 Expired
US7466852B2 Time resolved non-invasive diagnostics system Physics 5 Active
US8410568B2 Integrated photodiode for semiconductor substrates Electricity 3 Active
US7723724B2 System for using test structures to evaluate a fabrication of a wafer Electricity 2 Active
US10209274B2 Laser-assisted device alteration using synchronized laser pulses Physics 1 Active
US9361533B2 Apparatus and method for polarization diversity imaging and alignment Physics 0 Active
US11605525B2 System and method of preparing integrated circuits for backside probing using charged particle beams Electricity 0 Active
US11353479B2 Laser-assisted device alteration using synchronized laser pulses Physics 0 Active
US7009173B2 Lens mount integrated with a thermoelectrically cooled photodetector module Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.