Patent · US Expired

Integrated memory with memory cells in a plurality of memory cell blocks, and method of operating such a memory

US6721230B2 · kind B2 · utility

4Cited by
1References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 13, 2002
Grant dateApr 13, 2004
Priority date
Expiry dateSep 14, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated memory including memory cells in a plurality of memory cell blocks, each memory cell block being assigned at least one dedicated data line and a register circuit that can be written from outside the memory. At the start of a test operation, data is stored in the register circuits as reference data. During an access cycle, in each case in each of the memory cell blocks, a respective memory cell or a group of memory cells is selected, a respective read amplifier is activated and, in each of the register circuits, a comparison between the data read out and the reference data is carried out. As a result, the time required for the test operation of the memory is made comparatively low.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.