Patent · US Expired

Closed loop concentration control system for chemical mechanical polishing slurry

US6721628B1 · kind B1 · utility

9Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 28, 2000
Grant dateApr 13, 2004
Priority date
Expiry dateDec 5, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/12
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Polishing slurry is transported via piping to flow into the closed loop control system. First, the polishing slurry flows into the ultrasonic concentration detector. Original data of the polishing slurry that is determined by means of ultrasonic concentration detector is a fluid velocity at that time. This determined value can be converted into weight percent concentration at that time by memory data table. The converted data of weight percent concentration will be transmitted into program logic controller (PLC), and the data of liquid level volume in the distribution tank will be transmitted into program logic controller at present. The program logic controller will then analyze whether the quantity of oxidant is sufficient. If the quantity of oxidant does not reach the required criterion, the program logic controller will control the analog valve to transmit a supplementary quantity of oxidant into the distribution tank via the analog valve and piping.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.