Patent · US Expired

Method and configuration for protecting data during a self-test of a microcontroller

US6725407B2 · kind B2 · utility

11Cited by

4References

35Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Michael Richter · Ottobrunn, DE
Jan Otterstedt · Unterhaching, DE

Key dates

Filing date	Mar 25, 2002
Grant date	Apr 20, 2004
Priority date	—
Expiry date	Apr 15, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318533
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for protecting data during a self-test of a microcontrollers, in which all of the circuit elements within the microcontroller can be tested, where the course of the self-test cannot be altered via the external pins, and no intermediate results are passed to the outside via the pins. The invention also relates to an configuration in the form of an integrated circuit which can be used to implement the method, and to correspondingly equipped microcontrollers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.