Method for synchronized delta-VBE measurement for calculating die temperature
US6736540B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2003 |
| Grant date | May 18, 2004 |
| Priority date | — |
| Expiry date | Feb 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through a first switch and coupling a second capacitor to the temperature sensing element through a second switch. The first and second capacitors are external to the integrated circuit. The method further includes charging the first capacitor through the first switch to a first voltage when the temperature sensing element is being excited by the first switched current, charging the second capacitor through the second switch to a second voltage when the temperature sensing element is being excited by the second switched current, and measuring a difference between the first voltage and the second voltage to determine the temperature of the integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.