Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices
US6737671B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 26, 2002 |
| Grant date | May 18, 2004 |
| Priority date | — |
| Expiry date | Jul 24, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A current measurement circuit and method for testing a semiconductor device is provided. The method includes the steps of providing a semiconductor integrated circuit device including a voltage regulating circuit, the voltage regulating circuit being activated as needed to maintain a required voltage level; monitoring the voltage regulating circuit to determine a number of times it is activated during a sample period; and comparing the number of activations to a predetermined limit whereby if the number of activations exceeds the predetermined limit the semiconductor device is defective. The current measurement circuit includes an external clock for providing a clock signal; a first counter for counting when the voltage regulating circuit is activated; a second counter for counting clock cycles of a sample period; and a register for storing the number of activations, wherein the number of activations represents a relative current consumption value of the semiconductor device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.