Patent · US Expired

Method and apparatus for fault tolerant and flexible test signature generator

US6738939B2 · kind B2 · utility

18Cited by
13References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 2001
Grant dateMay 18, 2004
Priority date—
Expiry dateMay 14, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318547
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus with a generator to generate a pattern and multiple scan chains configured to receive the pattern from the generator. Multiple signature registers coupled to the scan chains, to receive an output of at least one of scan chains during a mode of the integrated device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.