Anthony Babella
5Patents
3h-index
12Co-inventors
46Inventor score
Filing activity: May 8, 2000 → Jun 7, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6668347B1 | Built-in self-testing for embedded memory | Physics | 40 | Expired |
| US6738939B2 | Method and apparatus for fault tolerant and flexible test signature generator | Physics | 18 | Expired |
| US7802146B2 | Loading test data into execution units in a graphics card to test execution | Physics | 4 | Active |
| US7904701B2 | Activating a design test mode in a graphics card having multiple execution units to bypass a host cache and transfer test instructions directly to an instruction cache | Physics | 1 | Active |
| US6650136B2 | Method and apparatus to enhance testability of logic coupled to IO buffers | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.