Patent · US Expired

Test system and methodology

US6744267B2 · kind B2 · utility

23Cited by

3References

48Claims

0Family size

Assignee

NPTest, Inc. · US

Inventors

Frank Sauk · San Ramon, US
Gary A. Wells · Fremont, US
Thomas P. Ho · Los Altos, US

Key dates

Filing date	Jul 16, 2002
Grant date	Jun 1, 2004
Priority date	—
Expiry date	Jul 16, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2886
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test system for testing an electronic device is deployable in two basic configurations. In one of the configurations, a load board (62) that receives a unit (60) of the device is directly attached to a test head (16). In the other configuration, the same load board or one having largely the same pattern of test-head signal transmission positions is coupled through an interface apparatus (66) to a test head. A probe system (64) contacts that load board or/and the interface apparatus. The interface apparatus is normally configured to largely prevent test-head vibrations from being transferred to the probe system. Additionally or alternatively, the load board is vacuum attached to the interface apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.