System and method for using and collecting information from a plurality of depth layers
US6744433B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2001 |
| Grant date | Jun 1, 2004 |
| Priority date | — |
| Expiry date | May 29, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method are provided for using information from at least one depth layer and for collecting information about at least one additional depth layer utilizing a graphics pipeline. Initially, constraining depth layers are provided which, in turn, define a plurality of depth constraints. Next, a plurality of tests is performed involving the constraining depth layers for collecting information about at least one additional depth layer. The information relating to the at least one depth layer may then be used to improve processing in the graphics pipeline. By the foregoing multiple tests, information relating to a plurality of depth layers may be collected during each of a plurality of rendering passes. Initially, information relating to the constraining depth layers and associated depth constraints is provided in the aforementioned manner. Thereafter, information relating to at least one additional depth layer is collected during additional rendering passes using multiple tests on each rendering pass. Once collected, such information relating to the constraining depth layers and the information relating to the at least one additional depth layer may be used to further improve…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.