Guided self-assembly of block copolymer films on interferometrically nanopatterned substrates
US6746825B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2001 |
| Grant date | Jun 8, 2004 |
| Priority date | — |
| Expiry date | Oct 5, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/2995
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Copolymer structures are formed by exposing a substrate with an imaging layer thereon to two or more beams of selected wavelengths to form interference patterns at the imaging layer to change the wettability of the imaging layer in accordance with the interference patterns. A layer of a selected block copolymer is deposited onto the exposed imaging layer and annealed to separate the components of the copolymer in accordance with the pattern of wettability and to replicate the pattern of the imaging layer in the copolymer layer. Stripes or isolated regions of the separated components may be formed with periodic dimensions in the range of 100 nm or less.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.