Single poly EEPROM with reduced area
US6747308B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2002 |
| Grant date | Jun 8, 2004 |
| Priority date | — |
| Expiry date | Dec 30, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2216/10
Abstract
An EEPROM (100) comprises a source region (122), a drain region (120); and a polysilicon layer (110). The polysilicon layer (110) comprises a floating gate comprising at least one polysilicon finger (112A-112E) operatively coupling the source region (122) and drain region (120) and a control gate comprising at least one of the polysilicon fingers (112A-112E) capacitively coupled to the floating gate. The EEPROM (100) has a substantially reduce area compared to prior art EEPROM since an n-well region is eliminated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.