Patent · US Expired

Bi-directional floating gate nonvolatile memory

US6747896B2 · kind B2 · utility

17Cited by
84References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 6, 2002
Grant dateJun 8, 2004
Priority date
Expiry dateAug 8, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory transistor has a pair of separate floating gates overlying end regions of a channel and a control gate that overlies the floating gates and a central region of the channel. The memory transistor effectively operates as a pair of floating gate transistors with an intervening select transistor. Each floating gate can be charged to store a distinct binary, analog, or multi-bit value. The direction of the channel current controls which floating gate receives channel hot electron injection during programming and which floating gate state is sensed during reading. A read operation biases the word line higher that the threshold voltage used to store data and compares the resulting channel to reference currents to identify a stored binary, analog, or multi-bit value. The threshold voltage range can include negative threshold voltages, which increases the available range for multi-bit-per-floating gate storage. The memory transistors can be integrated into a contactless array architecture having approximately one global bit/virtual ground line for every four floating gates along a row.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.