Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
US6749335B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2002 |
| Grant date | Jun 15, 2004 |
| Priority date | — |
| Expiry date | Jun 6, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An adjustment and calibration system for post-fabrication treatment of an on-chip temperature sensor is provided. As explained in detail below, the adjustment and calibration system includes at least one adjustment circuit, to which the on-chip temperature sensor is responsive, and a storage device that selectively stores control information (1) associated with a state of the adjustment circuit and/or (2) from a tester that writes such control information to the storage device, where the control information stored in the storage device is subsequently selectively read out in order to adjust the adjustment circuit to a state corresponding to the control information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.