Claude Gauthier
125Patents
15h-index
56Co-inventors
89Inventor score
Filing activity: Dec 29, 1989 → Jul 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6650157B2 | Using a push/pull buffer to improve delay locked loop performance | Electricity | 63 | Expired |
| US6377076B1 | Circuitry to support a power/area efficient method for high-frequency pre-emphasis for chip to chip signaling | Electricity | 49 | Expired |
| US6812758B2 | Negative bias temperature instability correction technique for delay locked loop and phase locked loop bias generators | Electricity | 26 | Expired |
| US6686785B2 | Deskewing global clock skew using localized DLLs | Electricity | 25 | Expired |
| US7129800B2 | Compensation technique to mitigate aging effects in integrated circuit components | Physics | 25 | Expired |
| US5155648A | Device for protecting a direct current electrical power supply from disturbances caused by connecting to it or disconnecting from it an electronic system | Emerging Cross-Sectional Technologies | 25 | Expired |
| US6996491B2 | Method and system for monitoring and profiling an integrated circuit die temperature | Physics | 21 | Expired |
| US6791360B2 | Source synchronous interface using variable digital data delay lines | Electricity | 18 | Expired |
| US6934652B2 | On-chip temperature measurement technique | Physics | 18 | Expired |
| US6476663B1 | Method for reducing supply noise near an on-die thermal sensor | Electricity | 18 | Expired |
| US6806698B2 | Quantifying a difference between nodal voltages | Electricity | 17 | Expired |
| US6882196B2 | Duty cycle corrector | Electricity | 17 | Expired |
| US6842351B2 | Method and apparatus for I/O resonance compensation | Electricity | 16 | Expired |
| US6781355B2 | I/O power supply resonance compensation technique | Electricity | 16 | Expired |
| US7996731B2 | Error detection in high-speed asymmetric interfaces | Physics | 15 | Active |
| US6850856B1 | I/O receiver thermal correction scheme | Physics | 15 | Expired |
| US6893154B2 | Integrated temperature sensor | Physics | 15 | Expired |
| US6566900B2 | Integrated on-chip process, temperature, and voltage sensor module | Physics | 14 | Expired |
| US6815986B2 | Design-for-test technique for a delay locked loop | Electricity | 14 | Expired |
| US6774653B2 | Two-pin thermal sensor calibration interface | Physics | 13 | Expired |
| US6914452B2 | Adaptive keeper sizing for dynamic circuits based on fused process corner data | Electricity | 13 | Expired |
| US6570423B1 | Programmable current source adjustment of leakage current for phase locked loop | Electricity | 12 | Expired |
| US6937958B2 | Controller for monitoring temperature | Electricity | 12 | Expired |
| US7054787B2 | Embedded integrated circuit aging sensor system | Physics | 12 | Expired |
| US6687881B2 | Method for optimizing loop bandwidth in delay locked loops | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.