Patent · US Expired

Abatement of effluents from chemical vapor deposition processes using organometallic source reagents

US6749671B2 · kind B2 · utility

370Cited by
20References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 2003
Grant dateJun 15, 2004
Priority date
Expiry dateFeb 5, 2023

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01D2259/40098
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to a organic or organometallic molecule such that upon exposure to heat such bond is readily cleavable, e.g., copper deposition process involving the formation of films on a substrate by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.