Automated multi-chip module handler and testing system

US6750666B2 · kind B2 · utility

Assignee

• Micron Technology, Inc. · US

Inventors

• Mark A. Tverdy · Boise, US
• William C. Layer · Boise, US
• Lothar Kress · Boise, US
• Eric Matthews · Nampa, US

Key dates

• Filing date: Aug 26, 2002
• Grant date: Jun 15, 2004
• Expiry date: Aug 26, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2887
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An automated multi-chip module (MCM) handler for automated module testing which employs a module feed employing a plurality of stackable magazines, the leading one of which in an input stack is positively displaced through an indexing device which positively retrieves each MCM and guides it to a test site. The test site includes a mechanism for positively engaging and aligning each MCM before engagement by the associated test contacts. In one embodiment, the test site includes a module locator bar having a first arrangement of alignment pins configured for engagement with a plurality of tooling holes formed in an MCM presented at the test site. The module locator bar may be configured to be replaceable with a second module locator bar having a second, different arrangement of alignment pins such that differently configured MCMs may be accommodated and positively aligned at the test site.