Patent · US Expired

Electromagnetic interference analysis method and apparatus

US6754598B2 · kind B2 · utility

6Cited by
4References
50Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 12, 2002
Grant dateJun 22, 2004
Priority date
Expiry dateAug 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of analyzing an electromagnetic interference amount of an LSI includes an equivalent impedance information calculating step of calculating and estimating equivalent impedance information based on circuit information of an LSI chip and package information of the LSI chip, and an electromagnetic interference noise calculating step of calculating an electromagnetic interference noise based on the equivalent impedance information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.