Kenji Shimazaki
23Patents
10h-index
36Co-inventors
75Inventor score
Filing activity: Apr 23, 1982 → Jul 30, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4696742A | Active carbon fibers and filter adsorption unit for water purification comprising said fibers | Textiles; Paper | 49 | Expired |
| US4576929A | Active carbon fibers as adsorbent for water purification | Textiles; Paper | 22 | Expired |
| US4861809A | Friction material | Mechanical Engineering; Lighting; Heating | 18 | Expired |
| US4412937A | Method for manufacture of activated carbon fiber | Chemistry; Metallurgy | 17 | Expired |
| US6812171B2 | Carbon fiber sheet and process for production thereof | Emerging Cross-Sectional Technologies | 14 | Expired |
| US4508851A | Fibrous activated carbon and process of producing it | Textiles; Paper | 14 | Expired |
| US7039572B1 | Method of analyzing electromagnetic interference | Physics | 13 | Expired |
| US4520623A | Activated carbon fiber spun yarn | Emerging Cross-Sectional Technologies | 12 | Expired |
| US7225418B2 | Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same | Physics | 11 | Expired |
| US6782347B2 | Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference | Physics | 10 | Expired |
| US6810340B2 | Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method | Physics | 9 | Expired |
| US6321168A | Means of calculating power consumption characteristic and method thereof | Physics | 7 | Expired |
| US7480875B2 | Method of designing a semiconductor integrated circuit | Physics | 7 | Active |
| US7278124B2 | Design method for semiconductor integrated circuit suppressing power supply noise | Physics | 6 | Expired |
| US6754598B2 | Electromagnetic interference analysis method and apparatus | Physics | 6 | Expired |
| US6876210B2 | Method and apparatus for analyzing electromagnetic interference | Physics | 6 | Expired |
| US8525552B2 | Semiconductor integrated circuit device having a plurality of standard cells for leakage current suppression | Electricity | 4 | Active |
| US6959250B1 | Method of analyzing electromagnetic interference | Physics | 4 | Expired |
| US7307333B2 | Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor device | Physics | 3 | Expired |
| US7120551B2 | Method for estimating EMI in a semiconductor device | Physics | 2 | Expired |
| US7911027B2 | Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device, and apparatus for generating pattern for semiconductor device | Physics | 1 | Active |
| US7779376B2 | Operation analysis method of semiconductor integrated circuit | Physics | 0 | Active |
| US8407312B2 | Data delivery apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.