Identification method for an article using crystal defects
US6760472B1 · kind B1 · utility
42Cited by
25References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 10, 1999 |
| Grant date | Jul 6, 2004 |
| Priority date | — |
| Expiry date | Dec 10, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor substrate has a peculiar crystal defect. Crystal defects in a fixed area of a substrate can be treated as data acquired by coding the distribution of the crystal defects. The coded data is utilized for certificate data of an IC card by identifying a semiconductor substrate itself.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.