Test access circuit and method of accessing embedded test controllers in integrated circuit modules
US6760874B2 · kind B2 · utility
36Cited by
6References
53Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 7, 2002 |
| Grant date | Jul 6, 2004 |
| Priority date | — |
| Expiry date | Jul 30, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318555
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test access circuit (TAC) for use in controlling test resources including child test access circuits (TACs) and/or test controllers, in an integrated circuit, comprises an enable input for enabling or disabling access to the test resources, a test port associated with each test resource, each test port including a test port enable output for connection to an enable input of an associated test resource; and an input for receiving a serial output of the associated test resource; and a selector for selecting a test resource for communication therewith.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.